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MCEM Facilities

MCEM supports four transmission electron microscopes, three scanning electron microscopes, a dual beam focussed ion beam (FIB) microscope and two three-dimensional atom probes, as well as a broad range of instrumentation for sample preparation and data analysis.

Transmission Electron Microscopes

Double-corrected FEI Titan3 80-300 FEGTEM (2008)

 
300kV (aligned for operation at 80kV, 200kV and 300kV); FEG-TEM/STEM; Super-Twin pole piece; CEOS Cs probe corrector; CEOS Cs image corrector; Fischione Instruments 3000 ADF detector; on-axis BF/DF detector; EDAX 30 mm2 retractable Si(Li) X-ray detector and TIA software, Gatan Tridiem 863 P image filter; Gatan UltraScan 1000 P (2kx2k) CCD camera; tomography and high stability tomography goniometer; Gatan 636 double-tilt cooling holder; HCHTR3000 double-tilt He holder; Fischione Instruments 2020 ultra-high tilt tomography holder; Fischione Instruments 2040 dual-axis advanced tomography holder; Fischione Instruments 2050 on-axis rotation tomography holder. Protochips Aduro 300 double-tilt heating holder to 1200°C. CCEM holder dry pumping station.

JEOL JEM 2100F FEGTEM (2008)

 

 

 200 kV; FEG-TEM/STEM; high resolution pole piece; piezo stage; oil free pumping system; Gatan UltraScan 1000 (2kx2k) CCD camera; tomography; Gatan 776 Enfina 1000 parallel detection EELS spectrometer; Gatan 777 STEM Pack; Gatan 692 retractable TV camera; JEOL 50 mm2 Si(Li) X-ray detector; Gatan 901 hot stage to 1000°C; Gatan 636 double-tilt liquid nitrogen cooling holder; JEOL tomography software; Fischione Instruments 2030 ultra-narrow gap advanced tomography holder; Gatan 655 turbo pumping station; Gatan Digital Streaming Video Software.

FEI Tecnai G2 F20 S-TWIN FEGTEM (2012)

 

 200kV; FEG–TEM/STEM; S-TWIN pole piece; Gatan SC200D Orius CCD camera (2kx2k) and Gatan 894 UltraScan 1000 CCD camera (2kx2k); low background double-tilt holder; Bruker Quantax 400 STEM X-ray analysis system with windowless 30mm2 SDD.

FEI Tecnai G2 T20 TWIN TEM (2012)

 

 200kV; LaB6; TWIN pole piece; Bruker Quantax 200 TEM X-ray analysis system and 30mm2 SDD with super light element window (slew); Gatan 831 SC600 Orius CCD camera (2.7kx2.7k) and Gatan SC200D Orius CCD camera (2kx2k); low background double-tilt holder; multi-specimen holder.

Scanning Electron Microscopes

JEOL JSM-7001F FEGSEM (2008) FEG; 5-axis stage; IR camera; retractable BE detector; turbo-molecular pump; Oxford Instruments 80 mm2 SDD and Aztec analysis system; OI Aztec electron backscattered diffraction (EBSD) system.
FEI Magellan 400 FEGSEM (2012) FEG; 5-axis stage, IR chamber camera; oil-free pumping system; retractable DBS annular BSE detector; retractable STEM 3 detector; quick loader; beam deceleration; in-lens detectors; NavCam+; plasma cleaner; cryo-trap; Bruker Quantax 400 X-ray analysis system and 30mm2 SDD with super light element window (slew).
FEI Nova NanoSEM 450 FEGSEM (2012)

FEG; 5-axis stage, IR chamber camera; oil-free pumping system; retractable DBS annular BSE detector; low vacuum imaging, LV-BSE detector; beam deceleration; in-lens detectors; NavCam; Helix detector; plasma cleaner; cryo-trap; Bruker Quantax 400 X-ray analysis system and 60mm2 SDD with super light element window (slew).

Focussed Ion Beam Microscope

FEI Quanta 3D FEG (2008) FEG; Ga FIB; Pt GIS; 4 quadrant BSE detector; retractable STEM detector; EDAX Pegasus X-ray analysis system with 10mm2 silicon drift detector (SDD) and ultra-thin window (UTW); TSL Hikari EBSD system; ESEM; 5 axis stage; IR chamber camera; Kleindiek in-situ and ex-situ lift-out; AutoFIB; AutoTEM; AutoSlice and View; cryo-trap; oil-free pumping system; Gatan X-ray ultraMicroscope (XuM) with microtomography stage.

3D Atom Probe Field Ion Microscopes

Kindbrisk 3D APFIM (2000) Kindbrisk 3D Atom Probe Field Ion Microscope
Oxford NanoScience 3D APFIM (2003) Oxford NanoScience 3D Atom Probe Field Ion Microscope

Other Equipment

Other equipment includes:

  • Allied Techprep polisher
  • Atom probe tip polisher (in-house)
  • Branson Sonifier 450
  • Buehler EcoMet 3000 grinder-polisher
  • Buehler Handimet 2 roll grinder, two units
  • Buehler IsoMet low speed saw
  • Cressington 208 HR sputter coater
  • Cressington 208 evaporative carbon coater
  • Ditabis Micron image plate reader
  • Dynavac carbon evaporative coater
  • Dynavac SC150 sputter coater
  • Gatan 601 ultrasonic disc cutter
  • Gatan 656 dimple grinder, two units
  • Gatan 682 Precision Etching and Coating System (PECS) and Perpendicular Slope Cutting Tool
  • Gatan 691 Precision Ion Polishing System (PIPS), two systems
  • Gatan 950 Solarus Advanced Plasma System
  • Leica EM UMC7 cryo-ultramicrotome
  • Leica M165C stereo optical microscope with digital camera
  • LKB KnifeMaker type 7801A
  • Olympus BX-51 stereo optical microscope with digital camera
  • Olympus SZX-16 stereo optical microscope with digital camera
  • Reichert Ultracut S and FCS cryo-ultramicrotome
  • Reichert Ultracut E ultramicrotome
  • Struers Accutom 50 precision saw
  • Struers Lectropol 5 electrolytic polisher
  • Struers Tenupol 2, 3, 5 twin jet electrolytic polishers
  • Technoorg-Linda Ltd Co. Gentle Mill 2