MCEM Purchases 4 New Electron Microscopes
Exciting news! MCEM has just purchased four major new electron microscopes that will greatly advance the research capability and capacity available to you in MCEM.
These new instruments, 2 FEG-SEMs, a FEG-TEM and a TEM, will bring a world-class SEM capability to MCEM and will bring excellent entry and mid-level TEM instruments, to complement our existing world-class instruments. They will replace our older SEMs and TEMs, providing vastly superior problem-solving capability, greater throughput and reliability and modern user interfaces.
The 4 new microscopes are from FEI Company and can be summarised as follows:
LaB6 TEM – a Tecnai G2 20 TWIN
An excellent entry-level TEM, with high throughput and reliability.
FEG-TEM - a Tecnai G2 F20 S-TWIN TMP
An analytical, higher-current instrument with a point resolution of 0.24nm (phase contrast imaging) and 0.21nm (ADF STEM) and modern chemical mapping capability.
FEG-SEM - a Magellan 400
An ultrahigh resolution FEG-SEM, including excellent low voltage performance.
Resolution better than 1nm at beam landing energy above 1 keV, better than 2nm at 200V, landing energy range 50 eV to 30 keV.
FEG-SEM – a Nova NanoSEM 450
A high-resolution FEG-SEM with low vacuum capability.
Resolution better than 2nm at beam landing energy above 1 keV, better than 2nm above 3 keV in low vacuum mode, landing energy range 50 eV to 30 keV.
MCEM is also upgrading our JEOL 7001F FEGSEM with a large solid angle SDD X-ray detector and upgraded X-ray analysis system enabling high speed X-ray mapping and integrated EBSD/X-ray studies.
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