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MCEM NewsMCEM Purchases 4 New Microscopes8 March 2012Exciting news! MCEM has just purchased four major new electron microscopes that will greatly advance the research capability and capacity available to you in MCEM. These new instruments, 2 FEG-SEMs, a FEG-TEM and a TEM, will bring a world-class SEM capability to MCEM and will bring excellent entry and mid-level TEM instruments, to complement our existing world-class instruments. They will replace our older SEMs and TEMs, providing vastly superior problem-solving capability, greater throughput and reliability and modern user interfaces. The 4 new microscopes are from FEI Company and can be summarised as follows: LaB6 TEM – a Tecnai G2 20 TWIN An excellent entry-level TEM, with high throughput and reliability. FEG-TEM - a Tecnai G2 F20 S-TWIN TMP An analytical, higher-current instrument with a point resolution of 0.24nm (phase contrast imaging) and 0.21nm (ADF STEM) and modern chemical mapping capability. FEG-SEM - a Magellan 400 An ultrahigh resolution FEG-SEM, including excellent low voltage performance. Resolution better than 1nm at beam landing energy above 1 keV, better than 2nm at 200V, landing energy range 50 eV to 30 keV. FEG-SEM – a Nova NanoSEM 450 A high-resolution FEG-SEM with low vacuum capability. Resolution better than 2nm at beam landing energy above 1 keV, better than 2nm above 3 keV in low vacuum mode, landing energy range 50 eV to 30 keV. MCEM is also upgrading our JEOL 7001F FEGSEM with a large solid angle SDD X-ray detector and upgraded X-ray analysis system enabling high speed X-ray mapping and integrated EBSD/X-ray studies.
Masters of electron microscopy rewarded29 February 2012
Dr Christian Dwyer and Dr Philip Nakashima
Two Monash University researchers have been recognised for pushing the frontiers in electron microscopy to solve mysteries at the atomic level. Dr Christian Dwyer and Dr Philip Nakashima, both of the Monash Centre for Electron Microscopy (MCEM), the ARC Centre of Excellence for Design in Light Metals and Department of Materials Engineering, took out both of the awards for research in the physical sciences presented by the Australian Microscopy and Microanalysis Society in Perth earlier this month. Dr Dwyer took home the FEI Company Cowley-Moodie Award for "developments in quantitative electron microscopy". Through innovative techniques, he has pushed the boundaries of what scientists can learn about materials using electron microscopy. Dr Nakashima was awarded the John Sanders Medal for "excellence in developing or applying electron microscope techniques". Dr Nakashima invented innovative methods to measure chemical bonding between atoms. He then used his techniques to solve an 80 year-old scientific mystery, discovering the arrangement of chemical bonds in aluminium. Director of the Monash Centre for Electron Microscopy, Professor Joanne Etheridge, congratulated the two researchers. “The ingenious research of Christian and Philip has pushed the limits of electron microscopy to enable some critical, long-standing problems in materials science to be solved," Professor Etheridge said. NewslettersIssue 3: December 2010 Issue 2: September 2010 Issue 1: June 2010 |